Cesar Acero, Derek Feltham, Yingdi Liu, Elham K. Moghaddam, Nilanjan Mukherjee, Marek Patyra, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Justyna Zawada. Embedded Deterministic Test Points. IEEE Trans. VLSI Syst., 25(10):2949-2961, 2017. [doi]
Abstract is missing.