Gladys Omayra Ducoudray Acevedo, Jaime Ramírez-Angulo. Innovative Built-In Self-Test Schemes for On-Chip Diagnosis, Compliant with the IEEE 1149.4 Mixed-Signal Test Bus Standard. In 2nd Latin American Test Workshop, LATW 2001, Cancun, Mexico, February 11-14, 2001. pages 131-134, IEEE, 2001.
@inproceedings{AcevedoR01,
title = {Innovative Built-In Self-Test Schemes for On-Chip Diagnosis, Compliant with the IEEE 1149.4 Mixed-Signal Test Bus Standard},
author = {Gladys Omayra Ducoudray Acevedo and Jaime Ramírez-Angulo},
year = {2001},
researchr = {https://researchr.org/publication/AcevedoR01},
cites = {0},
citedby = {0},
pages = {131-134},
booktitle = {2nd Latin American Test Workshop, LATW 2001, Cancun, Mexico, February 11-14, 2001},
publisher = {IEEE},
}