Innovative Built-In Self-Test Schemes for On-Chip Diagnosis, Compliant with the IEEE 1149.4 Mixed-Signal Test Bus Standard - researchr publication

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Gladys Omayra Ducoudray Acevedo, Jaime Ramírez-Angulo. Innovative Built-In Self-Test Schemes for On-Chip Diagnosis, Compliant with the IEEE 1149.4 Mixed-Signal Test Bus Standard. In 2nd Latin American Test Workshop, LATW 2001, Cancun, Mexico, February 11-14, 2001. pages 131-134, IEEE, 2001.

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