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Jayadev Acharya, Alon Orlitsky, Shengjun Pan. Recent results on pattern maximum likelihood. In Bruce E. Hajek, Leandros Tassiulas, Venkat Anantharam, Ioannis Kontoyiannis, editors, 2009 IEEE Information Theory Workshop, ITW 2009, Volos, Greece, June 10-12, 2009. pages 251-255, IEEE, 2009. [doi]

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