Jayadev Acharya, Alon Orlitsky, Shengjun Pan. Recent results on pattern maximum likelihood. In Bruce E. Hajek, Leandros Tassiulas, Venkat Anantharam, Ioannis Kontoyiannis, editors, 2009 IEEE Information Theory Workshop, ITW 2009, Volos, Greece, June 10-12, 2009. pages 251-255, IEEE, 2009. [doi]
@inproceedings{AcharyaOP09,
title = {Recent results on pattern maximum likelihood},
author = {Jayadev Acharya and Alon Orlitsky and Shengjun Pan},
year = {2009},
doi = {10.1109/ITWNIT.2009.5158581},
url = {https://doi.org/10.1109/ITWNIT.2009.5158581},
researchr = {https://researchr.org/publication/AcharyaOP09},
cites = {0},
citedby = {0},
pages = {251-255},
booktitle = {2009 IEEE Information Theory Workshop, ITW 2009, Volos, Greece, June 10-12, 2009},
editor = {Bruce E. Hajek and Leandros Tassiulas and Venkat Anantharam and Ioannis Kontoyiannis},
publisher = {IEEE},
isbn = {978-1-4244-4536-3},
}