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Jayadev Acharya, Alon Orlitsky, Shengjun Pan. Recent results on pattern maximum likelihood. In Bruce E. Hajek, Leandros Tassiulas, Venkat Anantharam, Ioannis Kontoyiannis, editors, 2009 IEEE Information Theory Workshop, ITW 2009, Volos, Greece, June 10-12, 2009. pages 251-255, IEEE, 2009. [doi]

The following publications are possibly variants of this publication:

The maximum likelihood probability of skewed patternsAlon Orlitsky, Shengjun Pan. isit 2009: 1130-1134 [doi]

On the theory and application of pattern maximum likelihoodShengjun Pan. PhD thesis, University of California, San Diego, USA, 2012. [doi]

Algebraic computation of pattern maximum likelihoodJayadev Acharya, Hirakendu Das, Alon Orlitsky, Shengjun Pan. isit 2011: 400-404 [doi]

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