Dhruva Acharyya, Kosuke Miyao, David Ting, Daniel Lam, Robert Smith, Pete Fitzpatrick, Brian Buras, John Williamson. Architecture and implementation of a truly parallel ATE capable of measuring pico ampere level current. In Bill Eklow, R. D. (Shawn) Blanton, editors, 2011 IEEE International Test Conference, ITC 2011, Anaheim, CA, USA, September 20-22, 2011. pages 1-10, IEEE, 2011. [doi]
Abstract is missing.