T. Adachi, M. Tanno, Tsuneta Sudo. Software Environment for 500 MHz VLSI Test System ULTIMATE . In Proceedings International Test Conference 1988, Washington, D.C., USA, September 1988. pages 114-119, IEEE Computer Society, 1988.
@inproceedings{AdachiTS88,
title = {Software Environment for 500 MHz VLSI Test System ULTIMATE },
author = {T. Adachi and M. Tanno and Tsuneta Sudo},
year = {1988},
tags = {meta-model, testing, Meta-Environment, meta-objects},
researchr = {https://researchr.org/publication/AdachiTS88},
cites = {0},
citedby = {0},
pages = {114-119},
booktitle = {Proceedings International Test Conference 1988, Washington, D.C., USA, September 1988},
publisher = {IEEE Computer Society},
}