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T. Adachi, M. Tanno, Tsuneta Sudo. Software Environment for 500 MHz VLSI Test System ULTIMATE . In Proceedings International Test Conference 1988, Washington, D.C., USA, September 1988. pages 114-119, IEEE Computer Society, 1988.
Possibly Related PublicationsThe following publications are possibly variants of this publication: Key Technologies for 500 MHz VLSI Test System ULTIMATE Teruo Tamama, Naoaki Narumi, Taiichi Otsuji, Masao Suzuki, Tsuneta Sudo. itc 1988: 108-113 Packaging Technologies for the 500 MHz VLSI Test System ULTIMATE Yoshimitsu Sakagawa, Yusio Akazawa, Naoaki Narumi, Akira Yoshii, Tsuneta Sudo. itc 1988: 120-125
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