Saman Adham, Sanjay Gupta. DP-BIST: A Built-In Self Test For DSP DataPaths A Low Overhead and High Fault Coverage Technique. In 5th Asian Test Symposium (ATS 96), November 20-22, 1996, Hsinchu, Taiwan. pages 205-212, IEEE Computer Society, 1996. [doi]
@inproceedings{AdhamG96,
title = {DP-BIST: A Built-In Self Test For DSP DataPaths A Low Overhead and High Fault Coverage Technique},
author = {Saman Adham and Sanjay Gupta},
year = {1996},
url = {http://csdl.computer.org/comp/proceedings/ats/1996/7478/00/74780205abs.htm},
tags = {test coverage, testing, coverage},
researchr = {https://researchr.org/publication/AdhamG96},
cites = {0},
citedby = {0},
pages = {205-212},
booktitle = {5th Asian Test Symposium (ATS 96), November 20-22, 1996, Hsinchu, Taiwan},
publisher = {IEEE Computer Society},
}