Amel Adouni, D. Chariag, Demba Diallo, Claude Delpha, Lassaâd Sbita. Statistical analysis of current-based features for dip voltage fault detection and isolation. In IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society, Beijing, China, October 29 - November 1, 2017. pages 4350-4354, IEEE, 2017. [doi]
Abstract is missing.