Mridul Agarwal, Kanak Agarwal, Dennis Sylvester, David Blaauw. Statistical modeling of cross-coupling effects in VLSI interconnects. In Ting-Ao Tang, editor, Proceedings of the 2005 Conference on Asia South Pacific Design Automation, ASP-DAC 2005, Shanghai, China, January 18-21, 2005. pages 503-506, ACM Press, 2005. [doi]
@inproceedings{AgarwalASB05,
title = {Statistical modeling of cross-coupling effects in VLSI interconnects},
author = {Mridul Agarwal and Kanak Agarwal and Dennis Sylvester and David Blaauw},
year = {2005},
doi = {10.1145/1120725.1120922},
url = {http://doi.acm.org/10.1145/1120725.1120922},
tags = {modeling},
researchr = {https://researchr.org/publication/AgarwalASB05},
cites = {0},
citedby = {0},
pages = {503-506},
booktitle = {Proceedings of the 2005 Conference on Asia South Pacific Design Automation, ASP-DAC 2005, Shanghai, China, January 18-21, 2005},
editor = {Ting-Ao Tang},
publisher = {ACM Press},
isbn = {0-7803-8737-6},
}