Statistical modeling of cross-coupling effects in VLSI interconnects

Mridul Agarwal, Kanak Agarwal, Dennis Sylvester, David Blaauw. Statistical modeling of cross-coupling effects in VLSI interconnects. In Ting-Ao Tang, editor, Proceedings of the 2005 Conference on Asia South Pacific Design Automation, ASP-DAC 2005, Shanghai, China, January 18-21, 2005. pages 503-506, ACM Press, 2005. [doi]

Abstract

Abstract is missing.