Statistical Clock Skew Analysis Considering Intra-Die Process Variations - researchr publication authors

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Aseem Agarwal, David Blaauw, Vladimir Zolotov. Statistical Clock Skew Analysis Considering Intra-Die Process Variations. In 2003 International Conference on Computer-Aided Design (ICCAD 03), November 9-13, 2003, San Jose, CA, USA. pages 914-921, IEEE Computer Society / ACM, 2003. [doi]

This author has not been identified. Look up 'Aseem Agarwal' in GoogleThis author has not been identified. Look up 'David Blaauw' in GoogleThis author has not been identified. Look up 'Vladimir Zolotov' in Google

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