Intra-die process parameter variation and leakage analysis of cache at the microarchitectural level - researchr publication authors

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Manjari Agarwal, Praveen Elakkumanan, Ramalingam Sridhar. Intra-die process parameter variation and leakage analysis of cache at the microarchitectural level. In 2007 IEEE International SOC Conference, Tampere, Finland, November 19-21, 2007. pages 79-82, IEEE, 2007. [doi]

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