Manjari Agarwal, Praveen Elakkumanan, Ramalingam Sridhar. Intra-die process parameter variation and leakage analysis of cache at the microarchitectural level. In 2007 IEEE International SOC Conference, Tampere, Finland, November 19-21, 2007. pages 79-82, IEEE, 2007. [doi]
@inproceedings{AgarwalES07,
title = {Intra-die process parameter variation and leakage analysis of cache at the microarchitectural level},
author = {Manjari Agarwal and Praveen Elakkumanan and Ramalingam Sridhar},
year = {2007},
doi = {10.1109/SOCC.2007.4545431},
url = {http://dx.doi.org/10.1109/SOCC.2007.4545431},
researchr = {https://researchr.org/publication/AgarwalES07},
cites = {0},
citedby = {0},
pages = {79-82},
booktitle = {2007 IEEE International SOC Conference, Tampere, Finland, November 19-21, 2007},
publisher = {IEEE},
isbn = {978-1-4244-1592-2},
}