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Amit Agarwal, Kunhyuk Kang, Swarup Bhunia, James D. Gallagher, Kaushik Roy. Device-Aware Yield-Centric Dual-V::t:: Design Under Parameter Variations in Nanoscale Technologies. IEEE Trans. VLSI Syst., 15(6):660-671, 2007. [doi]
Abstract is missing.