Mridul Agarwal, Bipul C. Paul, Ming Zhang, Subhasish Mitra. Circuit Failure Prediction and Its Application to Transistor Aging. In 25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA. pages 277-286, IEEE Computer Society, 2007. [doi]
@inproceedings{AgarwalPZM07,
title = {Circuit Failure Prediction and Its Application to Transistor Aging},
author = {Mridul Agarwal and Bipul C. Paul and Ming Zhang and Subhasish Mitra},
year = {2007},
doi = {10.1109/VTS.2007.22},
url = {http://dx.doi.org/10.1109/VTS.2007.22},
tags = {C++},
researchr = {https://researchr.org/publication/AgarwalPZM07},
cites = {0},
citedby = {0},
pages = {277-286},
booktitle = {25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA},
publisher = {IEEE Computer Society},
}