Mridul Agarwal, Bipul C. Paul, Ming Zhang, Subhasish Mitra. Circuit Failure Prediction and Its Application to Transistor Aging. In 25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA. pages 277-286, IEEE Computer Society, 2007. [doi]
Abstract is missing.