Nima Aghaee, Zebo Peng, Petru Eles. Efficient Test Application for Rapid Multi-Temperature Testing. In Alex K. Jones, Hai Helen Li, Ayse Kivilcim Coskun, Martin Margala, editors, Proceedings of the 25th edition on Great Lakes Symposium on VLSI, GLVLSI 2015, Pittsburgh, PA, USA, May 20 - 22, 2015. pages 3-8, ACM, 2015. [doi]
Abstract is missing.