A New BIST-based Test Approach with the Fault Location Capability for Communication Channels in Network-on-Chip

Babak Aghaei, Ahmad Khademzadeh, Midia Reshadi, Kambiz Badie. A New BIST-based Test Approach with the Fault Location Capability for Communication Channels in Network-on-Chip. J. Electronic Testing, 33(4):501-513, 2017. [doi]

Abstract

Abstract is missing.