Vishwani D. Agrawal, Dong Hyun Baik, Yong Chang Kim, Kewal K. Saluja. Exclusive Test and its Applications to Fault Diagnosis. In 16th International Conference on VLSI Design (VLSI Design 2003), 4-8 January 2003, New Delhi, India. pages 143-148, IEEE Computer Society, 2003. [doi]
Abstract is missing.