Ygor Q. Aguiar, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo A. L. Reis. Temperature dependence and ZTC bias point evaluation of sub 20nm bulk multigate devices. In 24th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2017, Batumi, Georgia, December 5-8, 2017. pages 270-273, IEEE, 2017. [doi]
Abstract is missing.