A. Ahilan, P. Deepa. Design for built-in FPGA reliability via fine-grained 2-D error correction codes. Microelectronics Reliability, 55(9-10):2108-2112, 2015. [doi]
@article{AhilanD15,
title = {Design for built-in FPGA reliability via fine-grained 2-D error correction codes},
author = {A. Ahilan and P. Deepa},
year = {2015},
doi = {10.1016/j.microrel.2015.06.075},
url = {http://dx.doi.org/10.1016/j.microrel.2015.06.075},
researchr = {https://researchr.org/publication/AhilanD15},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {55},
number = {9-10},
pages = {2108-2112},
}