Satyadev Ahlawat, Jaynarayan T. Tudu, Manoj Singh Gaur, Masahiro Fujita, Virendra Singh. Preventing Scan Attack through Test Response Encryption. In 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019. pages 1-6, IEEE, 2019. [doi]
Abstract is missing.