Satyadev Ahlawat, Jaynarayan T. Tudu, Anzhela Matrosova, Virendra Singh. A high performance scan flip-flop design for serial and mixed mode scan test. In 22nd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2016, Sant Feliu de Guixols, Spain, July 4-6, 2016. pages 233-238, IEEE, 2016. [doi]
@inproceedings{AhlawatTMS16,
title = {A high performance scan flip-flop design for serial and mixed mode scan test},
author = {Satyadev Ahlawat and Jaynarayan T. Tudu and Anzhela Matrosova and Virendra Singh},
year = {2016},
doi = {10.1109/IOLTS.2016.7604709},
url = {http://dx.doi.org/10.1109/IOLTS.2016.7604709},
researchr = {https://researchr.org/publication/AhlawatTMS16},
cites = {0},
citedby = {0},
pages = {233-238},
booktitle = {22nd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2016, Sant Feliu de Guixols, Spain, July 4-6, 2016},
publisher = {IEEE},
isbn = {978-1-5090-1507-8},
}