Satyadev Ahlawat, Jaynarayan T. Tudu, Anzhela Matrosova, Virendra Singh. A high performance scan flip-flop design for serial and mixed mode scan test. In 22nd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2016, Sant Feliu de Guixols, Spain, July 4-6, 2016. pages 233-238, IEEE, 2016. [doi]
Abstract is missing.