Satyadev Ahlawat, Darshit Vaghani, Jaynarayan T. Tudu, Virendra Singh. On Securing Scan Design from Scan-Based Side-Channel Attacks. In 26th IEEE Asian Test Symposium, ATS 2017, Taipei City, Taiwan, November 27-30, 2017. pages 58-63, IEEE Computer Society, 2017. [doi]
Abstract is missing.