On-chip stimuli generation for ADC dynamic test by ΣΔ technique

Shakeel Ahmad, Jerzy J. Dabrowski. On-chip stimuli generation for ADC dynamic test by ΣΔ technique. In 19th European Conference on Circuit Theory and Design, ECCTD 2009, Antalya, Turkey, August 23-27, 2009. pages 105-108, IEEE, 2009. [doi]

Abstract

Abstract is missing.