Soft Error Immune with Enhanced Critical Charge SIC14T SRAM Cell for Avionics Applications

Sagheer Ahmed, Jayesh Ambulkar, Debabrata Mondal, Ambika Prasad Shah. Soft Error Immune with Enhanced Critical Charge SIC14T SRAM Cell for Avionics Applications. In 31st IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2023, Dubai, United Arab Emirates, October 16-18, 2023. pages 1-6, IEEE, 2023. [doi]

Abstract

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