NeuroScrub+: Mitigating Retention Faults Using Flexible Approximate Scrubbing in Neuromorphic Fabric Based on Resistive Memories

Soyed Tuhin Ahmed, Michael Hefenbrock, Christopher Münch, Mehdi B. Tahoori. NeuroScrub+: Mitigating Retention Faults Using Flexible Approximate Scrubbing in Neuromorphic Fabric Based on Resistive Memories. IEEE Trans. on CAD of Integrated Circuits and Systems, 42(5):1490-1503, May 2023. [doi]

Authors

Soyed Tuhin Ahmed

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Michael Hefenbrock

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Christopher Münch

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Mehdi B. Tahoori

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