Soyed Tuhin Ahmed, Michael Hefenbrock, Christopher Münch, Mehdi B. Tahoori. NeuroScrub+: Mitigating Retention Faults Using Flexible Approximate Scrubbing in Neuromorphic Fabric Based on Resistive Memories. IEEE Trans. on CAD of Integrated Circuits and Systems, 42(5):1490-1503, May 2023. [doi]
@article{AhmedHMT23,
title = {NeuroScrub+: Mitigating Retention Faults Using Flexible Approximate Scrubbing in Neuromorphic Fabric Based on Resistive Memories},
author = {Soyed Tuhin Ahmed and Michael Hefenbrock and Christopher Münch and Mehdi B. Tahoori},
year = {2023},
month = {May},
doi = {10.1109/TCAD.2022.3205872},
url = {https://doi.org/10.1109/TCAD.2022.3205872},
researchr = {https://researchr.org/publication/AhmedHMT23},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {42},
number = {5},
pages = {1490-1503},
}