Improving Error Tolerance and Scalability in Pseudo-Boolean SAT-based Generic Side-Channel Analysis - researchr publication authors

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Shakil Ahmed, Dipali Jain, Kaveh Shamsi. Improving Error Tolerance and Scalability in Pseudo-Boolean SAT-based Generic Side-Channel Analysis. In IEEE International Test Conference, ITC 2025, San Diego, CA, USA, September 20-26, 2025. pages 434-437, IEEE, 2025. [doi]

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