Shakil Ahmed, Dipali Jain, Kaveh Shamsi. Improving Error Tolerance and Scalability in Pseudo-Boolean SAT-based Generic Side-Channel Analysis. In IEEE International Test Conference, ITC 2025, San Diego, CA, USA, September 20-26, 2025. pages 434-437, IEEE, 2025. [doi]
No references recorded for this publication.
No citations of this publication recorded.