Nisar Ahmed, C. P. Ravikumar, Mohammad Tehranipoor, Jim Plusquellic. At-Speed Transition Fault Testing With Low Speed Scan Enable. In 23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005, Palm Springs, CA, USA. pages 42-47, IEEE Computer Society, 2005. [doi]
Abstract is missing.