Soyed Tuhin Ahmed, Mehdi B. Tahoori. Fault-tolerant Neuromorphic Computing with Functional ATPG for Post-manufacturing Re-calibration. In 40th IEEE VLSI Test Symposium, VTS 2022, San Diego, CA, USA, April 25-27, 2022. pages 1-7, IEEE, 2022. [doi]
Abstract is missing.