Predicting SiC MOSFET Behavior Under Hard-Switching, Soft-Switching, and False Turn-On Conditions

Md Rishad Ahmed, Rebecca Todd, Andrew J. Forsyth. Predicting SiC MOSFET Behavior Under Hard-Switching, Soft-Switching, and False Turn-On Conditions. IEEE Transactions on Industrial Electronics, 64(11):9001-9011, 2017. [doi]

Authors

Md Rishad Ahmed

This author has not been identified. Look up 'Md Rishad Ahmed' in Google

Rebecca Todd

This author has not been identified. Look up 'Rebecca Todd' in Google

Andrew J. Forsyth

This author has not been identified. Look up 'Andrew J. Forsyth' in Google