Predicting SiC MOSFET Behavior Under Hard-Switching, Soft-Switching, and False Turn-On Conditions

Md Rishad Ahmed, Rebecca Todd, Andrew J. Forsyth. Predicting SiC MOSFET Behavior Under Hard-Switching, Soft-Switching, and False Turn-On Conditions. IEEE Transactions on Industrial Electronics, 64(11):9001-9011, 2017. [doi]

Abstract

Abstract is missing.