Role of transverse effective mass in Auger generation impacted planar III-V Tunnel FETs

Sheikh Z. Ahmed, Yaohua Tan, Avik W. Ghosh. Role of transverse effective mass in Auger generation impacted planar III-V Tunnel FETs. In Device Research Conference, DRC 2019, Ann Arbor, MI, USA, June 23-26, 2019. pages 95-96, IEEE, 2019. [doi]

Authors

Sheikh Z. Ahmed

This author has not been identified. Look up 'Sheikh Z. Ahmed' in Google

Yaohua Tan

This author has not been identified. Look up 'Yaohua Tan' in Google

Avik W. Ghosh

This author has not been identified. Look up 'Avik W. Ghosh' in Google