Design-For-Reliability Flow in 7nm Products with Data Center and Automotive Applications

Jae-Gyung Ahn, I-Ru Chen, Ping-Chin Yeh, Jonathan Chang. Design-For-Reliability Flow in 7nm Products with Data Center and Automotive Applications. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-5, IEEE, 2019. [doi]

Abstract

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