Sang-Uck Ahn, Beom-Kyu Seo, Hyun Woo Kim, Yeoun-Sook Shin, Hyung-Tae Kim, Ghil-Geun Oh, Young Dae Kim. Cost-Effective Test Method for screening out Unexpected Failure in High Speed Serial Interface IPs. In IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020. pages 1-4, IEEE, 2020. [doi]
Abstract is missing.