Intel 386:::TM::: EX Embedded Processor I::DDQ:: Testing - researchr publication authors

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Hitesh Ahuja, Dean Arriens, Ben Schneller, Vandana Verma, Wendy Whitman. Intel 386:::TM::: EX Embedded Processor I::DDQ:: Testing. In Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995. pages 902-909, IEEE Computer Society, 1995.

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