Hitesh Ahuja, Dean Arriens, Ben Schneller, Vandana Verma, Wendy Whitman. Intel 386:::TM::: EX Embedded Processor I::DDQ:: Testing. In Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995. pages 902-909, IEEE Computer Society, 1995.
@inproceedings{AhujaASVW95,
title = {Intel 386:::TM::: EX Embedded Processor I::DDQ:: Testing},
author = {Hitesh Ahuja and Dean Arriens and Ben Schneller and Vandana Verma and Wendy Whitman},
year = {1995},
tags = {testing},
researchr = {https://researchr.org/publication/AhujaASVW95},
cites = {0},
citedby = {0},
pages = {902-909},
booktitle = {Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995},
publisher = {IEEE Computer Society},
isbn = {0-7803-2992-9},
}