Fault-Based Test Case Generation for Component Connectors - researchr publication authors

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Bernhard K. Aichernig, Farhad Arbab, Lacramioara Astefanoaei, Frank S. de Boer, Sun Meng, Jan J. M. M. Rutten. Fault-Based Test Case Generation for Component Connectors. In Wei-Ngan Chin, Shengchao Qin, editors, TASE 2009, Third IEEE International Symposium on Theoretical Aspects of Software Engineering, 29-31 July 2009, Tianjin, China. pages 147-154, IEEE Computer Society, 2009. [doi]

This author has not been identified. Look up 'Bernhard K. Aichernig' in GoogleThis author has not been identified. Look up 'Farhad Arbab' in GoogleThis author has not been identified. Look up 'Lacramioara Astefanoaei' in GoogleThis author has not been identified. It may be one of the following persons:

Frank S. de Boer

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