Bernhard K. Aichernig, Farhad Arbab, Lacramioara Astefanoaei, Frank S. de Boer, Sun Meng, Jan J. M. M. Rutten. Fault-Based Test Case Generation for Component Connectors. In Wei-Ngan Chin, Shengchao Qin, editors, TASE 2009, Third IEEE International Symposium on Theoretical Aspects of Software Engineering, 29-31 July 2009, Tianjin, China. pages 147-154, IEEE Computer Society, 2009. [doi]
@inproceedings{AichernigAAB0R09,
title = {Fault-Based Test Case Generation for Component Connectors},
author = {Bernhard K. Aichernig and Farhad Arbab and Lacramioara Astefanoaei and Frank S. de Boer and Sun Meng and Jan J. M. M. Rutten},
year = {2009},
doi = {10.1109/TASE.2009.14},
url = {http://dx.doi.org/10.1109/TASE.2009.14},
tags = {rule-based, testing},
researchr = {https://researchr.org/publication/AichernigAAB0R09},
cites = {0},
citedby = {0},
pages = {147-154},
booktitle = {TASE 2009, Third IEEE International Symposium on Theoretical Aspects of Software Engineering, 29-31 July 2009, Tianjin, China},
editor = {Wei-Ngan Chin and Shengchao Qin},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-3757-3},
}