Test Challenge for Deep Sub-micron Era - Test & Diagnosis Platform: STARCAD-Clouseau - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Takashi Aikyo. Test Challenge for Deep Sub-micron Era - Test & Diagnosis Platform: STARCAD-Clouseau. In 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010, Kyoto, Japan, October 6-8, 2010. pages 227, IEEE Computer Society, 2010. [doi]

This author has not been identified. Look up 'Takashi Aikyo' in Google

runs on WebDSL