Takashi Aikyo. Test Challenge for Deep Sub-micron Era - Test & Diagnosis Platform: STARCAD-Clouseau. In 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010, Kyoto, Japan, October 6-8, 2010. pages 227, IEEE Computer Society, 2010. [doi]
@inproceedings{Aikyo10,
title = {Test Challenge for Deep Sub-micron Era - Test & Diagnosis Platform: STARCAD-Clouseau},
author = {Takashi Aikyo},
year = {2010},
doi = {10.1109/DFT.2010.34},
url = {http://doi.ieeecomputersociety.org/10.1109/DFT.2010.34},
researchr = {https://researchr.org/publication/Aikyo10},
cites = {0},
citedby = {0},
pages = {227},
booktitle = {25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010, Kyoto, Japan, October 6-8, 2010},
publisher = {IEEE Computer Society},
isbn = {978-1-4244-8447-8},
}