Takashi Aikyo, Hiroshi Takahashi, Yoshinobu Higami, Junichi Ootsu, Kyohei Ono, Yuzo Takamatsu. Timing-Aware Diagnosis for Small Delay Defects. In Cristiana Bolchini, Yong-Bin Kim, Adelio Salsano, Nur A. Touba, editors, 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 26-28 September 2007, Rome, Italy. pages 223-234, IEEE Computer Society, 2007. [doi]
@inproceedings{AikyoTHOOT07,
title = {Timing-Aware Diagnosis for Small Delay Defects},
author = {Takashi Aikyo and Hiroshi Takahashi and Yoshinobu Higami and Junichi Ootsu and Kyohei Ono and Yuzo Takamatsu},
year = {2007},
doi = {10.1109/DFT.2007.30},
url = {http://doi.ieeecomputersociety.org/10.1109/DFT.2007.30},
tags = {context-aware},
researchr = {https://researchr.org/publication/AikyoTHOOT07},
cites = {0},
citedby = {0},
pages = {223-234},
booktitle = {22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 26-28 September 2007, Rome, Italy},
editor = {Cristiana Bolchini and Yong-Bin Kim and Adelio Salsano and Nur A. Touba},
publisher = {IEEE Computer Society},
isbn = {0-7695-2885-6},
}