Takashi Aikyo, Hiroshi Takahashi, Yoshinobu Higami, Junichi Ootsu, Kyohei Ono, Yuzo Takamatsu. Timing-Aware Diagnosis for Small Delay Defects. In Cristiana Bolchini, Yong-Bin Kim, Adelio Salsano, Nur A. Touba, editors, 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 26-28 September 2007, Rome, Italy. pages 223-234, IEEE Computer Society, 2007. [doi]
Abstract is missing.