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A Comparison of Defect Models for Fault Location with I::DDQ:: Measurements

Robert C. Aitken. A Comparison of Defect Models for Fault Location with I::DDQ:: Measurements. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 778-787, IEEE Computer Society, 1992.

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